TOP STORY... May 6, 2009
Mentor Graphics is adding more powerful statistical analysis techniques to its yield diagnostics tool, Yield Assist. The diagnostics method combines the more-complex, compressed data available from logic testers with information from logic netlists and design layouts. The technique can narrow down problem areas on the die, and shorten the time required for failure analysis.
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Thursday, May 7, 2009
Mentor Enhancing Yield Diagnostics Tool
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