Wednesday, August 26, 2009

Imaging Bonded Wafer Defects for 3-D

from Semiconductor International

Au-Si Bonded Wafers (082509bond2330.jpg)
The range of products whose fabrication depends on wafer-to-wafer bonding is growing rapidly, and includes MEMS, wafer-level packaging and various types of 3-D integration. A practical, acoustic imaging technique is applied to bonded wafer pairs to image interface defects and wafer scratches in various materials. more » » » 

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